Ultrafast Dynamics Group
Frédéric Laquai's Group

Page 05/03/2016 13:36:47

Photo-thermal Deflection Spectroscopy (PDS) is up and running

Photo-Thermal Deflection Spectroscopy (PDS)
PDS is a non-destructive and highly-sensitive technique that measures the absorbance of semiconducting materials. Its biggest advantage compared to conventional absorption spectroscopy is its high sensitivity which allows detection of sub-bandgap features such as weakly absorbing charge-transfer states in organic semiconductor blends or Urbach tails in inorganic semiconductors.​​