Photo-thermal Deflection Spectroscopy (PDS) is up and running

01 March, 2016

Photo-Thermal Deflection Spectroscopy (PDS)
​PDS is a non-destructive and highly-sensitive technique that measures the absorbance of semiconducting materials. Its biggest advantage compared to conventional absorption spectroscopy is its high sensitivity which allows detection of sub-bandgap features such as weakly absorbing charge-transfer states in organic semiconductor blends or Urbach tails in inorganic semiconductors.​​

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